Atomic Spectrometry Update—Atomic Mass Spectrometry and X-Ray Fluorescence Spectrometry

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DOI 10.1039/JA993080261R

インパクトファクター 4.023

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要旨

Strong development continues in most areas of atomic mass spectrometry. There is an ever increasing pressure to push back limits with the result that reported performances in terms of absolute detection limits, sample requirement and isotopic abundance sensitivities are reaching levels that could only have been dreamed of a few years ago. This can have the drawback of extremely complex and expensive instrumentation which is only available to a few laboratories. There is an increasing tendency to decouple sample atomization and ionization with the result that various combinations are possible and the traditional definitions become less applicable. This is particularly true for techniques employing one or more lasers. It is however pleasing to report that attempts are being made to make instrumentation simpler and more practical for routine analyses. The combination of chromatography with atomic MS has received increasing attention with particular potential for metal speciation studies. Amongst the vast range of applications of atomic MS, the detection of low levels of contaminants in environmental samples and high-purity materials continues to be of prime importance.The past year has seen a continuing high level of publication in the XRF field once more indicating the rude health of this long-established multi-element instrumental analytical technique. Of particular note is the great interest in total reflection XRF (TXRF) and its rapid acceptance in the semiconductor industry for its ability to determine extremely low levels of surface contamination on wafers and also to carry out depth profiling on the same devices. One particular benefit of the technique when used in the semiconductor industry is that it is non-destructive—a clear benefit in reducing costs yet maintaining high product quality. In addition to TXRF the topics of XRMF and SRXRF are given increased prominence in this Update in line with the level of interest evident from the literature during the review period.

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Journal of Analytical Atomic Spectrometry

CiteScore: 6.2

自己引用率: 25.8%

年間論文数: 254

The Journal of Analytical Atomic Spectrometry (JAAS) is the central journal for publishing innovative research on fundamentals, instrumentation, and methods in the determination, speciation and isotopic analysis of (trace) elements within all fields of application. This includes, but is not restricted to, the most recent progress, developments and achievements in all forms of atomic and elemental detection, isotope ratio determination, molecular analysis, plasma-based analysis and X-ray techniques. The journal welcomes full papers, communications, technical notes, critical and tutorial review articles, editorials, and comments, in addition to the Atomic Spectrometry Updates (ASU) literature reviews that are prepared by an expert panel. Submissions are welcome in the following areas, but note this list reflects the current scope and authors are strongly encouraged to contact the Editorial team if they believe that their work offers potentially new and emerging research relevant to the journal remit: Fundamental studies in the following. New and existing sources for atomic emission, absorption, fluorescence and mass spectrometry and those that provide both atomic and molecular information Sample introduction techniques for solids, liquids, gases Improvements in sensitivity, selectivity, precision, accuracy and/or robustness Isotope ratio measurements, including techniques for improving precision and mass bias correction Single channel and multichannel simultaneous detection systems Chemometrics, statistics, calibration techniques and internal standardisation Theoretical and numerical modelling of fundamental processes related to all of the above methodologies Novel or improved methodologies in areas of application including, but not limited to the following. Biosciences, including elemental, speciation and isotopic analysis in biological systems, immunoassays based on metal-labeled antibodies, bio-imaging, and nanoparticle toxicology Geochemistry Environmental science Materials science, including engineered nanoparticles and quantum dots Metrology, including reference materials Forensic analysis Food and agricultural sciences Energy Archaeometry Molecular analysis. Molecular sources for elemental and isotopic analysis Atomic sources for molecular analysis Atomic and molecular techniques simultaneously used for complementary chemical information All contributions are judged on originality and quality of scientific content, and appropriateness of length to content of new science.